The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

Parallel test is a surefire method for speeding up production, and asynchronous parallel test has long been known as an effective way of significantly improving through-put while making the most of ...

Several new tests are proposed for examining the adequacy of a family of parametric models against large nonparametric alternatives. These tests formally check if the bias vector of residuals from ...

The use of optically-networked assemblies in defense and aerospace weapon systems is growing rapidly, and the optical test capabilities of the associated ATE is generally inadequate to provide ...

Linear models, generalized linear models, and nonlinear models are examples of parametric regression models because we know the function that describes the relationship between the response and ...

Keithley has introduced its third-generation on-wafer RF measurement capability for semiconductor parametric production process control. New to Keithley's third-generation RF Option is the ability to ...